Faraday's Induction Experiment in Nano-Transformers
Faraday's induction experiment in a nanometer scale was performed. Various nano-transformers with the smallest coupling area of approximately 1 mum 2 were fabricated, and the induced open circuit voltages were measured. The output responses showed linear dependences on both the magnitude and th...
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| Veröffentlicht in: | IEEE transactions on nanotechnology 2008-03, Vol.7 (2), p.120-123 |
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| container_end_page | 123 |
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| container_title | IEEE transactions on nanotechnology |
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| creator | Kim, Hyung Kwon Hwang, Jong Seung Hwang, Sung Woo Ahn, Doyeol |
| description | Faraday's induction experiment in a nanometer scale was performed. Various nano-transformers with the smallest coupling area of approximately 1 mum 2 were fabricated, and the induced open circuit voltages were measured. The output responses showed linear dependences on both the magnitude and the frequency of the input current. This suggested that the nano-transformer behaved as a linear transformer. The extracted mutual inductance value was approximately 30 nH and it was several orders larger than the one expected from 1 mum 2 coupling area. |
| doi_str_mv | 10.1109/TNANO.2007.909068 |
| format | Article |
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Various nano-transformers with the smallest coupling area of approximately 1 mum 2 were fabricated, and the induced open circuit voltages were measured. The output responses showed linear dependences on both the magnitude and the frequency of the input current. This suggested that the nano-transformer behaved as a linear transformer. The extracted mutual inductance value was approximately 30 nH and it was several orders larger than the one expected from 1 mum 2 coupling area.</description><identifier>ISSN: 1536-125X</identifier><identifier>EISSN: 1941-0085</identifier><identifier>DOI: 10.1109/TNANO.2007.909068</identifier><identifier>CODEN: ITNECU</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Circuits ; Current measurement ; Electromagnetic measurements ; Electromagnets ; Faraday ; Frequency ; Gold ; Inductance ; induction ; Joining ; Magnetic fields ; Magnetic materials ; Magnetic semiconductors ; nano ; Nanocomposites ; Nanomaterials ; Nanostructure ; Nanotechnology ; Open circuit voltage ; Scanning electron microscopy ; transformer ; Transformers</subject><ispartof>IEEE transactions on nanotechnology, 2008-03, Vol.7 (2), p.120-123</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2008</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c324t-e3b322eecf2fb1db2ca663f7dfe8c8c15718ccabb3ddcef06f092d1e3acfa6fd3</citedby><cites>FETCH-LOGICAL-c324t-e3b322eecf2fb1db2ca663f7dfe8c8c15718ccabb3ddcef06f092d1e3acfa6fd3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4359138$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4359138$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kim, Hyung Kwon</creatorcontrib><creatorcontrib>Hwang, Jong Seung</creatorcontrib><creatorcontrib>Hwang, Sung Woo</creatorcontrib><creatorcontrib>Ahn, Doyeol</creatorcontrib><title>Faraday's Induction Experiment in Nano-Transformers</title><title>IEEE transactions on nanotechnology</title><addtitle>TNANO</addtitle><description>Faraday's induction experiment in a nanometer scale was performed. Various nano-transformers with the smallest coupling area of approximately 1 mum 2 were fabricated, and the induced open circuit voltages were measured. The output responses showed linear dependences on both the magnitude and the frequency of the input current. This suggested that the nano-transformer behaved as a linear transformer. The extracted mutual inductance value was approximately 30 nH and it was several orders larger than the one expected from 1 mum 2 coupling area.</description><subject>Circuits</subject><subject>Current measurement</subject><subject>Electromagnetic measurements</subject><subject>Electromagnets</subject><subject>Faraday</subject><subject>Frequency</subject><subject>Gold</subject><subject>Inductance</subject><subject>induction</subject><subject>Joining</subject><subject>Magnetic fields</subject><subject>Magnetic materials</subject><subject>Magnetic semiconductors</subject><subject>nano</subject><subject>Nanocomposites</subject><subject>Nanomaterials</subject><subject>Nanostructure</subject><subject>Nanotechnology</subject><subject>Open circuit voltage</subject><subject>Scanning electron microscopy</subject><subject>transformer</subject><subject>Transformers</subject><issn>1536-125X</issn><issn>1941-0085</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkE1LAzEQhoMoWKs_QLwsXnramo9NNjmW0mqhtJcK3kI2mcCWNluTXbD_3q0rHjzNHJ73ZeZB6JHgKSFYvew2s812SjEupworLOQVGhFVkBxjya_7nTORE8o_btFdSnuMSSm4HCG2NNE4c56kbBVcZ9u6Cdni6wSxPkJoszpkGxOafBdNSL6JR4jpHt14c0jw8DvH6H252M3f8vX2dTWfrXPLaNHmwCpGKYD11FfEVdQaIZgvnQdppSW8JNJaU1XMOQseC48VdQSYsd4I79gYTYbeU2w-O0itPtbJwuFgAjRd0rLkWNACs558_kfumy6G_jitCKWKCiV6iAyQjU1KEbw-9U-aeNYE64tE_SNRXyTqQWKfeRoyNQD88QXjijDJvgFtfG7E</recordid><startdate>20080301</startdate><enddate>20080301</enddate><creator>Kim, Hyung Kwon</creator><creator>Hwang, Jong Seung</creator><creator>Hwang, Sung Woo</creator><creator>Ahn, Doyeol</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope><scope>KR7</scope></search><sort><creationdate>20080301</creationdate><title>Faraday's Induction Experiment in Nano-Transformers</title><author>Kim, Hyung Kwon ; Hwang, Jong Seung ; Hwang, Sung Woo ; Ahn, Doyeol</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c324t-e3b322eecf2fb1db2ca663f7dfe8c8c15718ccabb3ddcef06f092d1e3acfa6fd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Circuits</topic><topic>Current measurement</topic><topic>Electromagnetic measurements</topic><topic>Electromagnets</topic><topic>Faraday</topic><topic>Frequency</topic><topic>Gold</topic><topic>Inductance</topic><topic>induction</topic><topic>Joining</topic><topic>Magnetic fields</topic><topic>Magnetic materials</topic><topic>Magnetic semiconductors</topic><topic>nano</topic><topic>Nanocomposites</topic><topic>Nanomaterials</topic><topic>Nanostructure</topic><topic>Nanotechnology</topic><topic>Open circuit voltage</topic><topic>Scanning electron microscopy</topic><topic>transformer</topic><topic>Transformers</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kim, Hyung Kwon</creatorcontrib><creatorcontrib>Hwang, Jong Seung</creatorcontrib><creatorcontrib>Hwang, Sung Woo</creatorcontrib><creatorcontrib>Ahn, Doyeol</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Civil Engineering Abstracts</collection><jtitle>IEEE transactions on nanotechnology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kim, Hyung Kwon</au><au>Hwang, Jong Seung</au><au>Hwang, Sung Woo</au><au>Ahn, Doyeol</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Faraday's Induction Experiment in Nano-Transformers</atitle><jtitle>IEEE transactions on nanotechnology</jtitle><stitle>TNANO</stitle><date>2008-03-01</date><risdate>2008</risdate><volume>7</volume><issue>2</issue><spage>120</spage><epage>123</epage><pages>120-123</pages><issn>1536-125X</issn><eissn>1941-0085</eissn><coden>ITNECU</coden><abstract>Faraday's induction experiment in a nanometer scale was performed. Various nano-transformers with the smallest coupling area of approximately 1 mum 2 were fabricated, and the induced open circuit voltages were measured. The output responses showed linear dependences on both the magnitude and the frequency of the input current. This suggested that the nano-transformer behaved as a linear transformer. The extracted mutual inductance value was approximately 30 nH and it was several orders larger than the one expected from 1 mum 2 coupling area.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TNANO.2007.909068</doi><tpages>4</tpages></addata></record> |
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| identifier | ISSN: 1536-125X |
| ispartof | IEEE transactions on nanotechnology, 2008-03, Vol.7 (2), p.120-123 |
| issn | 1536-125X 1941-0085 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Circuits Current measurement Electromagnetic measurements Electromagnets Faraday Frequency Gold Inductance induction Joining Magnetic fields Magnetic materials Magnetic semiconductors nano Nanocomposites Nanomaterials Nanostructure Nanotechnology Open circuit voltage Scanning electron microscopy transformer Transformers |
| title | Faraday's Induction Experiment in Nano-Transformers |
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