Guest Editorial: Special Section on "Autonomous Silicon Validation and Testing of Microprocessors and Microprocessor-Based Systems"

The five papers in this special section focus on autonomous silicon validation and testing of microprocessors and microprocessor-based systems. The papers cover several important aspects of the technical area: from first silicon validation and debug to manufacturing and production testing, including...

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Veröffentlicht in:	IEEE transactions on very large scale integration (VLSI) systems 2007-05, Vol.15 (5), p.493-494
Hauptverfasser:	Gizopoulos, Dimitris, Aitken, Robert C., Kundu, Sandip
Format:	Artikel
Sprache:	eng
Schlagworte:	Application specific integrated circuits Built-in self-test Circuit testing Design for testability Integrated circuit technology Manufacturing Microprocessors Silicon Software testing System testing
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creator	Gizopoulos, Dimitris Aitken, Robert C. Kundu, Sandip
description	The five papers in this special section focus on autonomous silicon validation and testing of microprocessors and microprocessor-based systems. The papers cover several important aspects of the technical area: from first silicon validation and debug to manufacturing and production testing, including both software-based and hardware-based techniques and design-for-test methods that range from pure functional instruction-based to structural scan-based tests. The scope of the papers extends from embedded uniprocessors to multicore microprocessors.
doi_str_mv	10.1109/TVLSI.2007.896903
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subjects	Application specific integrated circuits Built-in self-test Circuit testing Design for testability Integrated circuit technology Manufacturing Microprocessors Silicon Software testing System testing
title	Guest Editorial: Special Section on "Autonomous Silicon Validation and Testing of Microprocessors and Microprocessor-Based Systems"
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