Guest Editorial: Special Section on "Autonomous Silicon Validation and Testing of Microprocessors and Microprocessor-Based Systems"
The five papers in this special section focus on autonomous silicon validation and testing of microprocessors and microprocessor-based systems. The papers cover several important aspects of the technical area: from first silicon validation and debug to manufacturing and production testing, including...
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Veröffentlicht in: | IEEE transactions on very large scale integration (VLSI) systems 2007-05, Vol.15 (5), p.493-494 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The five papers in this special section focus on autonomous silicon validation and testing of microprocessors and microprocessor-based systems. The papers cover several important aspects of the technical area: from first silicon validation and debug to manufacturing and production testing, including both software-based and hardware-based techniques and design-for-test methods that range from pure functional instruction-based to structural scan-based tests. The scope of the papers extends from embedded uniprocessors to multicore microprocessors. |
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ISSN: | 1063-8210 1557-9999 |
DOI: | 10.1109/TVLSI.2007.896903 |