Analysis of Total-Dose Response of a Bipolar Voltage Comparator Combining Radiation Experiments and Design Data

Analysis of Total-Dose Response of a Bipolar Voltage Comparator Combining Radiation Experiments and Design Data

A contribution to the understanding of total dose degradation using both AC small signal analysis and DC analysis in linear bipolar circuits is proposed. The reasoning is illustrated step by step on the basis of experimental results obtained on the LM 139. It is shown that the input stage is mostly...

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Veröffentlicht in:IEEE transactions on nuclear science 2006-08, Vol.53 (4), p.1910-1916
Hauptverfasser: Dusseau, L., Bernard, M.F., Boch, J., Vaille, J.-R., Saigne, F., Schrimpf, R.D., Lorfevre, E., David, J.P.
Format: Artikel
Sprache:eng
Schlagworte:
Amplifiers
Analog circuits
Analog integrated circuits
Bipolar analog circuits
Bipolar integrated circuits
Bipolar transistors
Circuit testing
circuitry
Circuits
Comparators
Degradation
Design engineering
Direct current
Electric potential
Failure analysis
integrated circuits (ICs)
linear voltage comparator
Radiation effects
Signal analysis
total dose
Voltage
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Beschreibung
Zusammenfassung:A contribution to the understanding of total dose degradation using both AC small signal analysis and DC analysis in linear bipolar circuits is proposed. The reasoning is illustrated step by step on the basis of experimental results obtained on the LM 139. It is shown that the input stage is mostly responsible for the degradation up to 20 krad. Above 20 krad, the total degradation is due to a combination of the input and the output stage degradation. The amplifier stage does not play a significant role in the circuit degradation
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2006.880950