The Effect of the Dielectric Layer Thickness on Spectral Performance of CdZnTe Frisch Collar Gamma Ray Spectrometers

The spectral performance as a function of the dielectric layer thickness for several CdZnTe Frisch collar devices was investigated. Seven different planar bar shaped detectors were fabricated from Redlen Technologies CdZnTe, and many Frisch collar devices were prepared from each planar device. The o...

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Veröffentlicht in:	IEEE transactions on nuclear science 2009-06, Vol.56 (3), p.824-831
Hauptverfasser:	Kargar, A., Brooks, A.C., Harrison, M.J., Kohman, K.T., Lowell, R.B., Keyes, R.C., Chen, H., Bindley, G., McGregor, D.S.
Format:	Artikel
Sprache:	eng
Schlagworte:	Cadmium zinc tellurides CdZnTe Frisch collar detector Charge carriers Coatings Collars Detectors Devices Dielectric devices dielectric thickness Dielectrics Dielectrics and electrical insulation Electric potential Electrochemical impedance spectroscopy Gamma ray spectrometers Geometry Laboratories Optimization Radio access networks Spectra
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Zusammenfassung:	The spectral performance as a function of the dielectric layer thickness for several CdZnTe Frisch collar devices was investigated. Seven different planar bar shaped detectors were fabricated from Redlen Technologies CdZnTe, and many Frisch collar devices were prepared from each planar device. The optimum dielectric layer thickness was experimentally determined for each device. The result of the optimal thickness study was verified through three-dimensional geometry modeling of the potential and electric field. It is shown that there exists an optimal dielectric layer thickness for best performance for CdZnTe Frisch collar devices with aspect ratios (L/W) greater than 2.5.
ISSN:	0018-9499 1558-1578
DOI:	10.1109/TNS.2009.2017193