Femtosecond optical nonlinearities of Au/TiO2 thin films prepared by a sputtering method

A multitarget sputtering method was applied to embed Au nanoparticles in TiO2 thin films (Au/TiO2 films) with a high concentration of Au particles (19–41 at%). The absolute values of imaginary part of the third-order nonlinear susceptibility, |Im [χ(3)]|, of the Au/TiO2 films, exhibited a peak aroun...

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Veröffentlicht in:Journal of materials research 2011-03, Vol.26 (6), p.763-769
Hauptverfasser: Tanahashi, Ichiro, Mito, Akihiro
Format: Artikel
Sprache:eng
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Zusammenfassung:A multitarget sputtering method was applied to embed Au nanoparticles in TiO2 thin films (Au/TiO2 films) with a high concentration of Au particles (19–41 at%). The absolute values of imaginary part of the third-order nonlinear susceptibility, |Im [χ(3)]|, of the Au/TiO2 films, exhibited a peak around the localized surface plasmon resonance absorption peak (around 660 nm), and the maximum value was estimated to be 3.6 × 10−7 esu measured by the femtosecond Z-scan technique. The figure of merit, |Im [χ(3)]|/α, (α is the absorption coefficient of the film at the corresponding wavelength of the measurement) of the film was calculated to be 1.4 × 10−12 esu·cm, which was larger than that of the Au/SiO2 film. This is mainly due to the local field enhancement.
ISSN:0884-2914
2044-5326
DOI:10.1557/jmr.2010.85