Improved Calculation of Charge Collection Probability From Within the Junction Well

In this paper, the challenges to compute the charge collection probability from within an L-shaped junction well using the existing analytical expression are discussed. A solution is proposed to overcome these challenges. A good agreement has been found between the results computed using the propose...

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Veröffentlicht in:IEEE transactions on electron devices 2011-12, Vol.58 (12), p.4434-4437
Hauptverfasser: Ong, V. K. S., Tan, C. C., Kurniawan, O., Radhakrishnan, K.
Format: Artikel
Sprache:eng
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Zusammenfassung:In this paper, the challenges to compute the charge collection probability from within an L-shaped junction well using the existing analytical expression are discussed. A solution is proposed to overcome these challenges. A good agreement has been found between the results computed using the proposed solution and those obtained from the finite-difference method and device simulator. The accuracy of the computed charge collection probability improves significantly when the proposed solution is used.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2011.2169071