Wavenumber domain analysis of two-dimensional SAW images captured by phase-sensitive laser probe system
This paper is aimed at demonstrating how the wavenumber domain analysis of two-dimensional (2-D) images captured by phase-sensitive laser probe systems is applied in the characterization of RF SAW devices. Effectiveness is demonstrated through the selective characterization of spurious resonance mod...
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| Veröffentlicht in: | IEEE transactions on ultrasonics, ferroelectrics, and frequency control ferroelectrics, and frequency control, 2007-05, Vol.54 (5), p.1072-1075 |
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| container_title | IEEE transactions on ultrasonics, ferroelectrics, and frequency control |
| container_volume | 54 |
| creator | Hashimoto, K. Kamizuma, H. Watanabe, M. Omori, T. Yamaguchi, M. |
| description | This paper is aimed at demonstrating how the wavenumber domain analysis of two-dimensional (2-D) images captured by phase-sensitive laser probe systems is applied in the characterization of RF SAW devices. Effectiveness is demonstrated through the selective characterization of spurious resonance modes and scattered, nonguided modes appearing in SAW resonators. |
| doi_str_mv | 10.1109/TUFFC.2007.353 |
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Effectiveness is demonstrated through the selective characterization of spurious resonance modes and scattered, nonguided modes appearing in SAW resonators.</description><identifier>ISSN: 0885-3010</identifier><identifier>EISSN: 1525-8955</identifier><identifier>DOI: 10.1109/TUFFC.2007.353</identifier><identifier>PMID: 17523572</identifier><identifier>CODEN: ITUCER</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Acoustic wave devices, piezoelectric and piezoresistive devices ; Acoustics ; Acoustics - instrumentation ; Algorithms ; Applied sciences ; Devices ; Electronics ; Exact sciences and technology ; Ferroelectric materials ; Fundamental areas of phenomenology (including applications) ; Image analysis ; Image Interpretation, Computer-Assisted - instrumentation ; Image Interpretation, Computer-Assisted - methods ; Laser modes ; Lasers ; Optical beams ; Physics ; Probes ; Radio frequencies ; Radio frequency ; Refractometry - instrumentation ; Refractometry - methods ; Resonance ; Resonators ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Sonication ; Surface acoustic wave devices ; Surface acoustic waves ; Surface emitting lasers ; Surface Properties ; Transduction; acoustical devices for the generation and reproduction of sound ; Two dimensional ; Two dimensional displays ; Wavenumber</subject><ispartof>IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2007-05, Vol.54 (5), p.1072-1075</ispartof><rights>2007 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2007</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c500t-955ff9f77adcef18bb35abe1b23a551da5e0b9cd22c1048b61b70b3d4e1a34a93</citedby><cites>FETCH-LOGICAL-c500t-955ff9f77adcef18bb35abe1b23a551da5e0b9cd22c1048b61b70b3d4e1a34a93</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4225319$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27923,27924,54757</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4225319$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=18733721$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/17523572$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Hashimoto, K.</creatorcontrib><creatorcontrib>Kamizuma, H.</creatorcontrib><creatorcontrib>Watanabe, M.</creatorcontrib><creatorcontrib>Omori, T.</creatorcontrib><creatorcontrib>Yamaguchi, M.</creatorcontrib><title>Wavenumber domain analysis of two-dimensional SAW images captured by phase-sensitive laser probe system</title><title>IEEE transactions on ultrasonics, ferroelectrics, and frequency control</title><addtitle>T-UFFC</addtitle><addtitle>IEEE Trans Ultrason Ferroelectr Freq Control</addtitle><description>This paper is aimed at demonstrating how the wavenumber domain analysis of two-dimensional (2-D) images captured by phase-sensitive laser probe systems is applied in the characterization of RF SAW devices. Effectiveness is demonstrated through the selective characterization of spurious resonance modes and scattered, nonguided modes appearing in SAW resonators.</description><subject>Acoustic wave devices, piezoelectric and piezoresistive devices</subject><subject>Acoustics</subject><subject>Acoustics - instrumentation</subject><subject>Algorithms</subject><subject>Applied sciences</subject><subject>Devices</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Ferroelectric materials</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>Image analysis</subject><subject>Image Interpretation, Computer-Assisted - instrumentation</subject><subject>Image Interpretation, Computer-Assisted - methods</subject><subject>Laser modes</subject><subject>Lasers</subject><subject>Optical beams</subject><subject>Physics</subject><subject>Probes</subject><subject>Radio frequencies</subject><subject>Radio frequency</subject><subject>Refractometry - instrumentation</subject><subject>Refractometry - methods</subject><subject>Resonance</subject><subject>Resonators</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Sonication</subject><subject>Surface acoustic wave devices</subject><subject>Surface acoustic waves</subject><subject>Surface emitting lasers</subject><subject>Surface Properties</subject><subject>Transduction; acoustical devices for the generation and reproduction of sound</subject><subject>Two dimensional</subject><subject>Two dimensional displays</subject><subject>Wavenumber</subject><issn>0885-3010</issn><issn>1525-8955</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><sourceid>EIF</sourceid><recordid>eNqF0c9rFDEUB_Agiq3VqxdBgqB4mTUvL2kmx7K4KhQ82NLjkMy8qVPmx5o3U9n_3qy7WPCgp5Dkk5fkfYV4CWoFoPyHq-vNZr3SSrkVWnwkTsFqW5Te2sfiVJWlLVCBOhHPmO-UAmO8fipOwFmN1ulTcXsT7mlchkhJNtMQulGGMfQ77lhOrZx_TkXTDTRyN-Vl-e3iRnZDuCWWddjOS6JGxp3cfg9MBe_Z3N2T7PM0yW2aIkne8UzDc_GkDT3Ti-N4Jq43H6_Wn4vLr5--rC8ui9oqNRf53W3rW-dCU1MLZYxoQySIGoO10ARLKvq60boGZcp4DtGpiI0hCGiCxzPx7lA3X_5jIZ6roeOa-j6MNC1cOWXR56__F6KxRqG3Gb7_J4RzB4hYGpPpm7_o3bSk3DeuvNIAxqk9Wh1QnSbmRG21TbmlaVeBqvaZVr8zrfaZVjnTfOD1seoSB2oe-DHEDN4eQeA69G0KY93xgysdotOQ3auD64joz7bR2iJ4_AWsvLKX</recordid><startdate>20070501</startdate><enddate>20070501</enddate><creator>Hashimoto, K.</creator><creator>Kamizuma, H.</creator><creator>Watanabe, M.</creator><creator>Omori, T.</creator><creator>Yamaguchi, M.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Solid state devices</topic><topic>Sonication</topic><topic>Surface acoustic wave devices</topic><topic>Surface acoustic waves</topic><topic>Surface emitting lasers</topic><topic>Surface Properties</topic><topic>Transduction; acoustical devices for the generation and reproduction of sound</topic><topic>Two dimensional</topic><topic>Two dimensional displays</topic><topic>Wavenumber</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hashimoto, K.</creatorcontrib><creatorcontrib>Kamizuma, H.</creatorcontrib><creatorcontrib>Watanabe, M.</creatorcontrib><creatorcontrib>Omori, T.</creatorcontrib><creatorcontrib>Yamaguchi, M.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Aerospace Database</collection><collection>MEDLINE - Academic</collection><jtitle>IEEE transactions on ultrasonics, ferroelectrics, and frequency control</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hashimoto, K.</au><au>Kamizuma, H.</au><au>Watanabe, M.</au><au>Omori, T.</au><au>Yamaguchi, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Wavenumber domain analysis of two-dimensional SAW images captured by phase-sensitive laser probe system</atitle><jtitle>IEEE transactions on ultrasonics, ferroelectrics, and frequency control</jtitle><stitle>T-UFFC</stitle><addtitle>IEEE Trans Ultrason Ferroelectr Freq Control</addtitle><date>2007-05-01</date><risdate>2007</risdate><volume>54</volume><issue>5</issue><spage>1072</spage><epage>1075</epage><pages>1072-1075</pages><issn>0885-3010</issn><eissn>1525-8955</eissn><coden>ITUCER</coden><abstract>This paper is aimed at demonstrating how the wavenumber domain analysis of two-dimensional (2-D) images captured by phase-sensitive laser probe systems is applied in the characterization of RF SAW devices. 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| source | IEEE Electronic Library (IEL) |
| subjects | Acoustic wave devices, piezoelectric and piezoresistive devices Acoustics Acoustics - instrumentation Algorithms Applied sciences Devices Electronics Exact sciences and technology Ferroelectric materials Fundamental areas of phenomenology (including applications) Image analysis Image Interpretation, Computer-Assisted - instrumentation Image Interpretation, Computer-Assisted - methods Laser modes Lasers Optical beams Physics Probes Radio frequencies Radio frequency Refractometry - instrumentation Refractometry - methods Resonance Resonators Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Sonication Surface acoustic wave devices Surface acoustic waves Surface emitting lasers Surface Properties Transduction acoustical devices for the generation and reproduction of sound Two dimensional Two dimensional displays Wavenumber |
| title | Wavenumber domain analysis of two-dimensional SAW images captured by phase-sensitive laser probe system |
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