Wavenumber domain analysis of two-dimensional SAW images captured by phase-sensitive laser probe system

This paper is aimed at demonstrating how the wavenumber domain analysis of two-dimensional (2-D) images captured by phase-sensitive laser probe systems is applied in the characterization of RF SAW devices. Effectiveness is demonstrated through the selective characterization of spurious resonance mod...

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Veröffentlicht in:	IEEE transactions on ultrasonics, ferroelectrics, and frequency control ferroelectrics, and frequency control, 2007-05, Vol.54 (5), p.1072-1075
Hauptverfasser:	Hashimoto, K., Kamizuma, H., Watanabe, M., Omori, T., Yamaguchi, M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Acoustic wave devices, piezoelectric and piezoresistive devices Acoustics Acoustics - instrumentation Algorithms Applied sciences Devices Electronics Exact sciences and technology Ferroelectric materials Fundamental areas of phenomenology (including applications) Image analysis Image Interpretation, Computer-Assisted - instrumentation Image Interpretation, Computer-Assisted - methods Laser modes Lasers Optical beams Physics Probes Radio frequencies Radio frequency Refractometry - instrumentation Refractometry - methods Resonance Resonators Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Sonication Surface acoustic wave devices Surface acoustic waves Surface emitting lasers Surface Properties Transduction acoustical devices for the generation and reproduction of sound Two dimensional Two dimensional displays Wavenumber
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Beschreibung
Zusammenfassung:	This paper is aimed at demonstrating how the wavenumber domain analysis of two-dimensional (2-D) images captured by phase-sensitive laser probe systems is applied in the characterization of RF SAW devices. Effectiveness is demonstrated through the selective characterization of spurious resonance modes and scattered, nonguided modes appearing in SAW resonators.
ISSN:	0885-3010 1525-8955
DOI:	10.1109/TUFFC.2007.353