Parasitics extraction with multipole refinement

Modern chip design pushes the performance of a given technology to its limits, therefore, it is necessary to find increasingly more accurate models for interconnect parasitics. The growing complexity of today's integrated systems, however, makes fast analysis crucial as well. We present a novel hierarchical potential evaluation technique which is able to represent detailed near-field and global far-field couplings with equal accuracy and efficiency by combining the best features of known hierarchical approaches in this field.