X-Ray Focusing: Techniques and Applications

Ali Khounsary 1 and Stephen L. O'Dell 2 and Gene Ice 3 1, Argonne National Laboratory, Argonne, IL, USA 2, NASA Marshal Space Flight Center, Huntsville, AL, USA 3, Oak Ridge National Laboratory, Oak Ridge, TN, USA Received 31 December 2010; Accepted 31 December 2010 This Special Issue of X-Ray Optics and Instrumentation comprises ten review papers and six research articles, which collectively offer a broad overview of X-ray focusing techniques and applications in laboratory measurements, in synchrotron beamlines, and in X-ray astronomy.