Low-frequency noise measurements as an investigation tool of pixel flickering in cooled Hg0.7Cd0.3Te focal plane arrays

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Veröffentlicht in:	IEEE transactions on electron devices 2005-05, Vol.52 (5), p.928-933
Hauptverfasser:	PEREZ, Jean-Philippe, MYARA, Mikhael, ALABEDRA, Robert, ORSAL, Bernard, LEYRIS, Cédric, TOURRENC, Jean-Philippe, SIGNORET, Philippe
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Bolometer infrared, submillimeter wave, microwave and radiowave receivers and detectors Electronics Exact sciences and technology General equipment and techniques Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques Instruments, apparatus, components and techniques common to several branches of physics and astronomy Optoelectronic devices Physics Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Sensors (chemical, optical, electrical, movement, gas, etc.) remote sensing
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