A New Method for RTS Noise of Semiconductor Devices Identification
In this paper, a new method, called the noise scattering pattern method (NSP method), for random telegraph signal noise identification in the inherent noise of semiconductor devices is described. A block diagram of a noise measurement system based on the NSP method is presented. Examples of patterns...
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| Veröffentlicht in: | IEEE transactions on instrumentation and measurement 2008-06, Vol.57 (6), p.1199-1206 |
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| container_issue | 6 |
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| container_title | IEEE transactions on instrumentation and measurement |
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| creator | Konczakowska, A. Cichosz, J. Szewczyk, A. |
| description | In this paper, a new method, called the noise scattering pattern method (NSP method), for random telegraph signal noise identification in the inherent noise of semiconductor devices is described. A block diagram of a noise measurement system based on the NSP method is presented. Examples of patterns of the NSP method are included. |
| doi_str_mv | 10.1109/TIM.2007.915098 |
| format | Article |
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| ispartof | IEEE transactions on instrumentation and measurement, 2008-06, Vol.57 (6), p.1199-1206 |
| issn | 0018-9456 1557-9662 |
| language | eng |
| recordid | cdi_proquest_journals_862404797 |
| source | IEEE Electronic Library (IEL) |
| subjects | Block diagrams Frequency domain analysis Gaussian noise Instrumentation Low-frequency noise Noise Noise generators Noise level Noise measurement Noise scattering pattern method (NSP method) random telegraph signal (RTS) noise Scattering Semiconductor device noise Semiconductor devices Telegraphy White noise |
| title | A New Method for RTS Noise of Semiconductor Devices Identification |
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