A SiGe BiCMOS Instrumentation Channel for Extreme Environment Applications

An instrumentation channel is designed, implemented, and tested in a 0.5-μm SiGe BiCMOS process. The circuit features a reconfigurable Wheatstone bridge network that interfaces an assortment of external sensors to signal processing circuits. Also, analog sampling is implemented in the channel using...

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Veröffentlicht in:VLSI Design 2010-01, Vol.2010 (2010), p.3-14
Hauptverfasser: Chen, Suheng, Broughton, Richard S., Fu, Guoyuan, Blalock, Benjamin J., Britton, Charles L., Ericson, M. Nance, Mantooth, H. Alan, Mojarradi, Mohammad M., Berger, Richard W., Cressler, John D., Ulaganathan, Chandradevi, Tham, Kevin, Prothro, Benjamin S., Yager, Jeremy A., Nambiar, Neena, Cornett, Kimberly, Greenwell, Robert L.
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Sprache:eng
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Zusammenfassung:An instrumentation channel is designed, implemented, and tested in a 0.5-μm SiGe BiCMOS process. The circuit features a reconfigurable Wheatstone bridge network that interfaces an assortment of external sensors to signal processing circuits. Also, analog sampling is implemented in the channel using a flying capacitor configuration. The analog samples are digitized by a low-power multichannel A/D converter. Measurement results show that the instrumentation channel supports input signals up to 200 Hz and operates across a wide temperature range of -180°C to 125°C. This work demonstrates the use of a commercially available first generation SiGe BiCMOS process in designing circuits suitable for extreme environment applications.
ISSN:1065-514X
1563-5171
DOI:10.1155/2010/156829