Nanoanalysis of interfacial chemistry

Nanoanalysis of interfacial chemistry

In recent years, atom probe tomography has advanced to an outstanding tool of analyzing interfacial chemistry in nanostructured materials. In this article, quantitative measurements of the natural width of multilayer interfaces and of segregation at grain boundaries and even at separate triple junct...

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Veröffentlicht in:JOM (1989) 2010-12, Vol.62 (12), p.58-63
Hauptverfasser: Schmitz, G., Ene, C., Galinski, H., Schlesiger, R., Stender, P.
Format: Artikel
Sprache:eng
Schlagworte:
Analytical chemistry
Annealing
Chemistry
Chemistry/Food Science
Earth Sciences
Engineering
Environment
Equilibrium
Grain boundaries
Interfaces
Materials research
Microscopy
Nanostructured materials
Overview
Physical properties
Physics
Studies
Thermodynamics
Tomography
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Beschreibung
Zusammenfassung:In recent years, atom probe tomography has advanced to an outstanding tool of analyzing interfacial chemistry in nanostructured materials. In this article, quantitative measurements of the natural width of multilayer interfaces and of segregation at grain boundaries and even at separate triple junctions of the boundary structure are presented and their physical consequences discussed.
ISSN:1047-4838
1543-1851
DOI:10.1007/s11837-010-0182-8