Temperature Dependence of Creep and Hardness of Sn-Ag-Cu Lead-Free Solder
The creep behavior and hardness of Sn-3.5Ag-0.7Cu solder were studied using Berkovich depth-sensing indentation at temperatures of 25°C to 125°C. Assuming a power-law relationship between the creep strain rate and stress, an activation energy of 40 kJ/mol and stress exponents of 7.4, 5.5, and 3.7 at...
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Veröffentlicht in: | Journal of electronic materials 2010-02, Vol.39 (2), p.223-229 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The creep behavior and hardness of Sn-3.5Ag-0.7Cu solder were studied using Berkovich depth-sensing indentation at temperatures of 25°C to 125°C. Assuming a power-law relationship between the creep strain rate and stress, an activation energy of 40 kJ/mol and stress exponents of 7.4, 5.5, and 3.7 at 25°C, 75°C, and 125°C, respectively, were obtained. The results revealed that, with increasing temperature, the creep penetration and steady-state creep strain rate increased whereas the stress exponent decreased. The stress exponent and activation energy results also suggested that the creep mechanism is dislocation climb, assisted by diffusion through dislocation cores in Sn. Furthermore, the hardness results exhibited a decreasing trend with increasing temperature, which is attributed to softening at high temperature. |
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ISSN: | 0361-5235 1543-186X |
DOI: | 10.1007/s11664-009-0970-5 |