11‐1: AI‐based Interaction Commonality Analysis

11‐1: AI‐based Interaction Commonality Analysis

As display technology advances, display manufacturing processes are getting complicated. Therefore, the origins of failures are not always from one process. Under the circumstances, applying the conventional statistical methods to commonality analysis of multifaceted processes is difficult because t...

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Veröffentlicht in:SID International Symposium Digest of technical papers 2023-06, Vol.54 (1), p.121-124
Hauptverfasser: Park, Soyeong, Kim, Misuk, Yoon, Seokhyun, Hwang, Nayeon, Bae, Jung-suk, Kim, Myeonghwa, Seo, Jeehun, Lee, Dooyoul, Kang, Jung-Tae, Yoo, Jeong-il
Format: Artikel
Sprache:eng
Schlagworte:
Artificial intelligence
Commonality
Display devices
Failure commonality analysis
interaction analysis
machine learning
manufacturing
quality control
Statistical methods
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Beschreibung
Zusammenfassung:As display technology advances, display manufacturing processes are getting complicated. Therefore, the origins of failures are not always from one process. Under the circumstances, applying the conventional statistical methods to commonality analysis of multifaceted processes is difficult because the number of cases to be considered is millions. Herein, we propose an effective method for interaction commonality analysis of display failures using artificial intelligence, enabling to successfully achieve 90% detection performance.
ISSN:0097-966X
2168-0159
DOI:10.1002/sdtp.16503