Improving High-Speed Interconnect Modeling: The Theta-Method for Accurate Simulation of Skin Effect and Computational Efficiency

This paper presents a novel θ-method for modeling coupled interconnects in high-speed electronic circuits, addressing the limitations of conventional Finite-Difference Time-Domain (FDTD) techniques. The proposed method enhances simulation efficiency and accuracy, particularly in scenarios involving...

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Veröffentlicht in:ITM web of conferences 2024, Vol.69, p.4009
Hauptverfasser: Ait Errais, Mouaad, Ait Belaid, Khaoula, Belahrach, Hassan, Zeroual, Abdelouhab
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Ait Belaid, Khaoula
Belahrach, Hassan
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description This paper presents a novel θ-method for modeling coupled interconnects in high-speed electronic circuits, addressing the limitations of conventional Finite-Difference Time-Domain (FDTD) techniques. The proposed method enhances simulation efficiency and accuracy, particularly in scenarios involving high frequencies and the skin effect. Through comparative analyses with established FDTD methods, we demonstrate that the θ-method not only achieves significantly shorter computation times but also provides greater accuracy and stability. The results indicate that the θ-method is a robust and reliable alternative, offering improved performance in both simulation speed and precision for complex interconnect modeling tasks.
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source DOAJ Directory of Open Access Journals; EDP Open; Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals
subjects Accuracy
Electronic circuits
Finite difference time domain method
High speed
Skin effect
Task complexity
title Improving High-Speed Interconnect Modeling: The Theta-Method for Accurate Simulation of Skin Effect and Computational Efficiency
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