Improving High-Speed Interconnect Modeling: The Theta-Method for Accurate Simulation of Skin Effect and Computational Efficiency

This paper presents a novel θ-method for modeling coupled interconnects in high-speed electronic circuits, addressing the limitations of conventional Finite-Difference Time-Domain (FDTD) techniques. The proposed method enhances simulation efficiency and accuracy, particularly in scenarios involving high frequencies and the skin effect. Through comparative analyses with established FDTD methods, we demonstrate that the θ-method not only achieves significantly shorter computation times but also provides greater accuracy and stability. The results indicate that the θ-method is a robust and reliable alternative, offering improved performance in both simulation speed and precision for complex interconnect modeling tasks.