Surface and interface chemistry of bromine–methanol‐etched Cd0.9Zn0.1Te crystals

Chemical polishing or chemo‐mechanical polishing is crucial as a last step of surface preparation to remove the damaged layer and contaminants from the surface of CdZnTe crystals. The bromine–methanol solution is widely used for this purpose. However, bromine–methanol solution enriches the surface w...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Surface and interface analysis 2024-10, Vol.56 (10), p.713-719
Hauptverfasser: Ünal, Mustafa, Karaman, Mehmet Can, Çelik, Gülçin, Tüzel, Okay, Balbaşı, Özden Başar, Genç, Ayşe Merve, Turan, Raşit
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 719
container_issue 10
container_start_page 713
container_title Surface and interface analysis
container_volume 56
creator Ünal, Mustafa
Karaman, Mehmet Can
Çelik, Gülçin
Tüzel, Okay
Balbaşı, Özden Başar
Genç, Ayşe Merve
Turan, Raşit
description Chemical polishing or chemo‐mechanical polishing is crucial as a last step of surface preparation to remove the damaged layer and contaminants from the surface of CdZnTe crystals. The bromine–methanol solution is widely used for this purpose. However, bromine–methanol solution enriches the surface with Te and results in poor performance of CdZnTe crystals. In this study, the effect of the chemical polishing with 5% bromine–methanol solution on the surface and at the interface is investigated and it is demonstrated that etching duration strongly influences surface stoichiometry and interface contaminants. The evolution of the surface topography with etching and chemical changes are presented. It is shown that after 90 s etching/polishing, subsurface damage is removed and Te enrichment is minimum. Moreover, interface layer thickness is the smallest for 90 s etching duration. It is presented that further increase in the etching duration disturbs the surface stoichiometry and interface depth. It also calculated that 90 s of etching shows low interface barrier and symmetrical current–voltage curve.
doi_str_mv 10.1002/sia.7338
format Article
fullrecord <record><control><sourceid>proquest_wiley</sourceid><recordid>TN_cdi_proquest_journals_3114471613</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3114471613</sourcerecordid><originalsourceid>FETCH-LOGICAL-p1518-a9622e281a8e84556c6662ad0947834118cfe3658d4c9d1e26d78a122ad8d82f3</originalsourceid><addsrcrecordid>eNotkM1KAzEUhYMoWKvgIwy4npqbZDI3y1L8KRRctG7chDjJ0CnzZzJFZtdHEHzDPokpdXW48J174CPkHugMKGWPoTKznHO8IBOgSqZKAV6SCQXBUiYYXJObEHaUUuQoJ2Sz3vvSFC4xrU2qdnDnq9i6pgqDH5OuTD5911StOx5-GzdsTdvVx8OPGyJjk4WlM_XRxvFNbPkxDKYOt-SqjOHu_nNK3p-fNovXdPX2slzMV2kPGWBqlGTMMQSDDkWWyUJKyYylSuTIBQAWpeMyQysKZcExaXM0wCKCFlnJp-Th_Lf33dfehUHvur1v46TmAELkIIFHKj1T31XtRt37qjF-1ED1SZiOwvRJmF4v56fkfyNNYAY</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3114471613</pqid></control><display><type>article</type><title>Surface and interface chemistry of bromine–methanol‐etched Cd0.9Zn0.1Te crystals</title><source>Access via Wiley Online Library</source><creator>Ünal, Mustafa ; Karaman, Mehmet Can ; Çelik, Gülçin ; Tüzel, Okay ; Balbaşı, Özden Başar ; Genç, Ayşe Merve ; Turan, Raşit</creator><creatorcontrib>Ünal, Mustafa ; Karaman, Mehmet Can ; Çelik, Gülçin ; Tüzel, Okay ; Balbaşı, Özden Başar ; Genç, Ayşe Merve ; Turan, Raşit</creatorcontrib><description>Chemical polishing or chemo‐mechanical polishing is crucial as a last step of surface preparation to remove the damaged layer and contaminants from the surface of CdZnTe crystals. The bromine–methanol solution is widely used for this purpose. However, bromine–methanol solution enriches the surface with Te and results in poor performance of CdZnTe crystals. In this study, the effect of the chemical polishing with 5% bromine–methanol solution on the surface and at the interface is investigated and it is demonstrated that etching duration strongly influences surface stoichiometry and interface contaminants. The evolution of the surface topography with etching and chemical changes are presented. It is shown that after 90 s etching/polishing, subsurface damage is removed and Te enrichment is minimum. Moreover, interface layer thickness is the smallest for 90 s etching duration. It is presented that further increase in the etching duration disturbs the surface stoichiometry and interface depth. It also calculated that 90 s of etching shows low interface barrier and symmetrical current–voltage curve.</description><identifier>ISSN: 0142-2421</identifier><identifier>EISSN: 1096-9918</identifier><identifier>DOI: 10.1002/sia.7338</identifier><language>eng</language><publisher>Bognor Regis: Wiley Subscription Services, Inc</publisher><subject>Bromine ; bromine methanol ; Cadmium zinc tellurides ; CdZnTe crystals ; Chemical damage ; Chemical polishing ; Contaminants ; Crystals ; Etching ; interface chemistry ; Mechanical polishing ; Methanol ; Stoichiometry ; surface analysis ; Surface preparation ; Thickness ; XPS analysis ; X‐ray and gamma‐ray detectors</subject><ispartof>Surface and interface analysis, 2024-10, Vol.56 (10), p.713-719</ispartof><rights>2024 John Wiley &amp; Sons Ltd.</rights><rights>2024 John Wiley &amp; Sons, Ltd.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><orcidid>0000-0001-5829-4724</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fsia.7338$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fsia.7338$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1417,27924,27925,45574,45575</link.rule.ids></links><search><creatorcontrib>Ünal, Mustafa</creatorcontrib><creatorcontrib>Karaman, Mehmet Can</creatorcontrib><creatorcontrib>Çelik, Gülçin</creatorcontrib><creatorcontrib>Tüzel, Okay</creatorcontrib><creatorcontrib>Balbaşı, Özden Başar</creatorcontrib><creatorcontrib>Genç, Ayşe Merve</creatorcontrib><creatorcontrib>Turan, Raşit</creatorcontrib><title>Surface and interface chemistry of bromine–methanol‐etched Cd0.9Zn0.1Te crystals</title><title>Surface and interface analysis</title><description>Chemical polishing or chemo‐mechanical polishing is crucial as a last step of surface preparation to remove the damaged layer and contaminants from the surface of CdZnTe crystals. The bromine–methanol solution is widely used for this purpose. However, bromine–methanol solution enriches the surface with Te and results in poor performance of CdZnTe crystals. In this study, the effect of the chemical polishing with 5% bromine–methanol solution on the surface and at the interface is investigated and it is demonstrated that etching duration strongly influences surface stoichiometry and interface contaminants. The evolution of the surface topography with etching and chemical changes are presented. It is shown that after 90 s etching/polishing, subsurface damage is removed and Te enrichment is minimum. Moreover, interface layer thickness is the smallest for 90 s etching duration. It is presented that further increase in the etching duration disturbs the surface stoichiometry and interface depth. It also calculated that 90 s of etching shows low interface barrier and symmetrical current–voltage curve.</description><subject>Bromine</subject><subject>bromine methanol</subject><subject>Cadmium zinc tellurides</subject><subject>CdZnTe crystals</subject><subject>Chemical damage</subject><subject>Chemical polishing</subject><subject>Contaminants</subject><subject>Crystals</subject><subject>Etching</subject><subject>interface chemistry</subject><subject>Mechanical polishing</subject><subject>Methanol</subject><subject>Stoichiometry</subject><subject>surface analysis</subject><subject>Surface preparation</subject><subject>Thickness</subject><subject>XPS analysis</subject><subject>X‐ray and gamma‐ray detectors</subject><issn>0142-2421</issn><issn>1096-9918</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNotkM1KAzEUhYMoWKvgIwy4npqbZDI3y1L8KRRctG7chDjJ0CnzZzJFZtdHEHzDPokpdXW48J174CPkHugMKGWPoTKznHO8IBOgSqZKAV6SCQXBUiYYXJObEHaUUuQoJ2Sz3vvSFC4xrU2qdnDnq9i6pgqDH5OuTD5911StOx5-GzdsTdvVx8OPGyJjk4WlM_XRxvFNbPkxDKYOt-SqjOHu_nNK3p-fNovXdPX2slzMV2kPGWBqlGTMMQSDDkWWyUJKyYylSuTIBQAWpeMyQysKZcExaXM0wCKCFlnJp-Th_Lf33dfehUHvur1v46TmAELkIIFHKj1T31XtRt37qjF-1ED1SZiOwvRJmF4v56fkfyNNYAY</recordid><startdate>202410</startdate><enddate>202410</enddate><creator>Ünal, Mustafa</creator><creator>Karaman, Mehmet Can</creator><creator>Çelik, Gülçin</creator><creator>Tüzel, Okay</creator><creator>Balbaşı, Özden Başar</creator><creator>Genç, Ayşe Merve</creator><creator>Turan, Raşit</creator><general>Wiley Subscription Services, Inc</general><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-5829-4724</orcidid></search><sort><creationdate>202410</creationdate><title>Surface and interface chemistry of bromine–methanol‐etched Cd0.9Zn0.1Te crystals</title><author>Ünal, Mustafa ; Karaman, Mehmet Can ; Çelik, Gülçin ; Tüzel, Okay ; Balbaşı, Özden Başar ; Genç, Ayşe Merve ; Turan, Raşit</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p1518-a9622e281a8e84556c6662ad0947834118cfe3658d4c9d1e26d78a122ad8d82f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Bromine</topic><topic>bromine methanol</topic><topic>Cadmium zinc tellurides</topic><topic>CdZnTe crystals</topic><topic>Chemical damage</topic><topic>Chemical polishing</topic><topic>Contaminants</topic><topic>Crystals</topic><topic>Etching</topic><topic>interface chemistry</topic><topic>Mechanical polishing</topic><topic>Methanol</topic><topic>Stoichiometry</topic><topic>surface analysis</topic><topic>Surface preparation</topic><topic>Thickness</topic><topic>XPS analysis</topic><topic>X‐ray and gamma‐ray detectors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ünal, Mustafa</creatorcontrib><creatorcontrib>Karaman, Mehmet Can</creatorcontrib><creatorcontrib>Çelik, Gülçin</creatorcontrib><creatorcontrib>Tüzel, Okay</creatorcontrib><creatorcontrib>Balbaşı, Özden Başar</creatorcontrib><creatorcontrib>Genç, Ayşe Merve</creatorcontrib><creatorcontrib>Turan, Raşit</creatorcontrib><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Surface and interface analysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ünal, Mustafa</au><au>Karaman, Mehmet Can</au><au>Çelik, Gülçin</au><au>Tüzel, Okay</au><au>Balbaşı, Özden Başar</au><au>Genç, Ayşe Merve</au><au>Turan, Raşit</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Surface and interface chemistry of bromine–methanol‐etched Cd0.9Zn0.1Te crystals</atitle><jtitle>Surface and interface analysis</jtitle><date>2024-10</date><risdate>2024</risdate><volume>56</volume><issue>10</issue><spage>713</spage><epage>719</epage><pages>713-719</pages><issn>0142-2421</issn><eissn>1096-9918</eissn><abstract>Chemical polishing or chemo‐mechanical polishing is crucial as a last step of surface preparation to remove the damaged layer and contaminants from the surface of CdZnTe crystals. The bromine–methanol solution is widely used for this purpose. However, bromine–methanol solution enriches the surface with Te and results in poor performance of CdZnTe crystals. In this study, the effect of the chemical polishing with 5% bromine–methanol solution on the surface and at the interface is investigated and it is demonstrated that etching duration strongly influences surface stoichiometry and interface contaminants. The evolution of the surface topography with etching and chemical changes are presented. It is shown that after 90 s etching/polishing, subsurface damage is removed and Te enrichment is minimum. Moreover, interface layer thickness is the smallest for 90 s etching duration. It is presented that further increase in the etching duration disturbs the surface stoichiometry and interface depth. It also calculated that 90 s of etching shows low interface barrier and symmetrical current–voltage curve.</abstract><cop>Bognor Regis</cop><pub>Wiley Subscription Services, Inc</pub><doi>10.1002/sia.7338</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0001-5829-4724</orcidid></addata></record>
fulltext fulltext
identifier ISSN: 0142-2421
ispartof Surface and interface analysis, 2024-10, Vol.56 (10), p.713-719
issn 0142-2421
1096-9918
language eng
recordid cdi_proquest_journals_3114471613
source Access via Wiley Online Library
subjects Bromine
bromine methanol
Cadmium zinc tellurides
CdZnTe crystals
Chemical damage
Chemical polishing
Contaminants
Crystals
Etching
interface chemistry
Mechanical polishing
Methanol
Stoichiometry
surface analysis
Surface preparation
Thickness
XPS analysis
X‐ray and gamma‐ray detectors
title Surface and interface chemistry of bromine–methanol‐etched Cd0.9Zn0.1Te crystals
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T11%3A44%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_wiley&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Surface%20and%20interface%20chemistry%20of%20bromine%E2%80%93methanol%E2%80%90etched%20Cd0.9Zn0.1Te%20crystals&rft.jtitle=Surface%20and%20interface%20analysis&rft.au=%C3%9Cnal,%20Mustafa&rft.date=2024-10&rft.volume=56&rft.issue=10&rft.spage=713&rft.epage=719&rft.pages=713-719&rft.issn=0142-2421&rft.eissn=1096-9918&rft_id=info:doi/10.1002/sia.7338&rft_dat=%3Cproquest_wiley%3E3114471613%3C/proquest_wiley%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=3114471613&rft_id=info:pmid/&rfr_iscdi=true