Fatigue Driving State Detection Based on Spatial Characteristics of EEG Signals
Monitoring the driver’s physical and mental state based on wearable EEG acquisition equipment, especially the detection and early warning of fatigue, is a key issue in the research of the brain–computer interface in human–machine intelligent fusion driving. Comparing and analyzing the waking (alert)...
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Veröffentlicht in: | Electronics (Basel) 2024-09, Vol.13 (18), p.3742 |
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Zusammenfassung: | Monitoring the driver’s physical and mental state based on wearable EEG acquisition equipment, especially the detection and early warning of fatigue, is a key issue in the research of the brain–computer interface in human–machine intelligent fusion driving. Comparing and analyzing the waking (alert) state and fatigue state by simulating EEG data during simulated driving, this paper proposes a brain functional network construction method based on a phase locking value (PLV) and phase lag index (PLI), studies the relationship between brain regions, and quantitatively analyzes the network structure. The characteristic parameters of the brain functional network that have significant differences in fatigue status are screened out and constitute feature vectors, which are then combined with machine learning algorithms to complete classification and identification. The experimental results show that this method can effectively distinguish between alertness and fatigue states. The recognition accuracy rates of 52 subjects are all above 70%, with the highest recognition accuracy reaching 89.5%. Brain network topology analysis showed that the connectivity between brain regions was weakened under a fatigue state, especially under the PLV method, and the phase synchronization relationship between delta and theta frequency bands was significantly weakened. The research results provide a reference for understanding the interdependence of brain regions under fatigue conditions and the development of fatigue driving detection systems. |
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ISSN: | 2079-9292 2079-9292 |
DOI: | 10.3390/electronics13183742 |