Wavelike Periodic Structures on the Silicon Surface Initiated by Irradiation with a Focused Gallium Ion Beam
We investigate the processes of microrelief formation on a Si(100) surface under irradiation with a Ga + -ion beam with an energy of 30 keV and a fluence of D = 1.25 × 10 18 –2 × 10 19 cm –2 at incident angles of θ = 30°–85°. Within the angular range of θ = 40°–70°, a faceted wavy relief forms on th...
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Veröffentlicht in: | Surface investigation, x-ray, synchrotron and neutron techniques x-ray, synchrotron and neutron techniques, 2024-08, Vol.18 (4), p.822-833 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We investigate the processes of microrelief formation on a Si(100) surface under irradiation with a Ga
+
-ion beam with an energy of 30 keV and a fluence of
D
= 1.25 × 10
18
–2 × 10
19
cm
–2
at incident angles of θ = 30°–85°. Within the angular range of θ = 40°–70°, a faceted wavy relief forms on the Si surface, while at θ = 30°, a sinusoidal relief develops. An experimental dependence of the periodic structure wavelength as a function of irradiation time λ(
t
) ~
t
n
, where
n
= 0.33–0.35, is obtained. The average values of relief propagation velocities and their direction relative to the incident ion direction are determined for θ = 30° and 40°, amounting to –5.3 ± 0.6 and –6.3 ± 0.6 nm s
–1
, respectively. The results are discussed in detail within the framework of existing models of wavelike surface relief formation under ion bombardment. |
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ISSN: | 1027-4510 1819-7094 |
DOI: | 10.1134/S1027451024700514 |