Characterization of Bi12SiO20 single crystal: understanding structural and thermal properties

This study presents a thorough examination of the structural and thermal characteristics of Bi 12 SiO 20 crystal. X-ray diffraction (XRD) analysis was employed to investigate the crystallographic structure, while scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) were utiliz...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Applied physics. A, Materials science & processing Materials science & processing, 2024-10, Vol.130 (10), Article 735
Hauptverfasser:	Altuntas, G., Isik, M., Gasanly, N. M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Activation energy Bismuth silicon oxide Characterization and Evaluation of Materials Condensed Matter Physics Crystal structure Crystallization Crystallography Decomposition Differential scanning calorimetry Differential thermal analysis Endothermic reactions Machines Manufacturing Morphology Nanotechnology Optical and Electronic Materials Phase transitions Physics Physics and Astronomy Processes Single crystals Structural analysis Surfaces and Interfaces Thermodynamic properties Thermogravimetric analysis Thin Films Weight loss X-ray diffraction
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!