Characterization of Bi12SiO20 single crystal: understanding structural and thermal properties

This study presents a thorough examination of the structural and thermal characteristics of Bi 12 SiO 20 crystal. X-ray diffraction (XRD) analysis was employed to investigate the crystallographic structure, while scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) were utilized to ascertain morphological features and elemental composition, respectively. The XRD spectrum exhibited numerous peaks corresponding to the cubic crystalline structure. Thermal behavior was investigated through thermal gravimetric analysis (TGA), differential thermal analysis (DTA) and differential scanning calorimetry (DSC). Within the crystal, negligible weight loss was observed up to 750 °C, followed by weight loss processes occurring in the temperature ranges of 750–919 °C and above 919 °C. The 2% weight loss in the range of 750–919 °C was associated with the decomposition process, and the activation energy of this process was found to be 199 kJ/mol considering Coats-Redfern expression. A significant weight loss was observed in the region above 919 o C and was associated with the decomposition of the Bi 12 SiO 20 compound and/or the melting processes of the components of the Bi 12 SiO 20 compound. Three endothermic peaks were observed in the DTA plot. Additionally, DSC measurements conducted under varied heating rates indicated endothermic crystallization process around 348 °C, with an activation energy of 522 kJ/mol determined through the Kissenger equation. These findings present valuable details regarding the crystal’s structural configuration, morphological attributes, and decomposition/phase transitions, thereby illuminating its potential applications across various fields.