Time-of-Flight-type Photoelectron Emission Microscopy with a 10.9-eV Laser

We have developed a novel photoemission microscopy apparatus employing a vacuum ultraviolet laser. This setup combines photoemission electron microscopy (PEEM) with a time-of-flight detector, facilitating rapid visualization of electronic states in both real and momentum space. Achieving a spatial r...

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Veröffentlicht in:	E-journal of surface science and nanotechnology 2024/02/17, Vol.22(2), pp.170-173
Hauptverfasser:	Tsuda, Shunsuke, Yaji, Koichiro
Format:	Artikel
Sprache:	eng
Schlagworte:	Electron states Electronic property Emission microscopy Momentum microscope Photoelectric emission Photoelectrons Photoemission spectroscopy Single crystals Spatial resolution Time of flight Ultraviolet laser Ultraviolet lasers
Online-Zugang:	Volltext
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