Effects of CZT Substrate Surface Treatment on IR-Transmittance in the Annealing Process

The application of CdZnTe(CZT) crystals in infrared focal plane detectors and x-ray imaging detectors is hindered by the low infrared transmittance (IRT) and the presence of Cd/Te inclusions/precipitation. Over the preceding decades, strategies involving Cd vapor control during the growth process an...

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Veröffentlicht in:	Journal of electronic materials 2024-10, Vol.53 (10), p.6333-6339
Hauptverfasser:	Xu, Chao, Li, Shangshu, Zhou, Changhe
Format:	Artikel
Sprache:	eng
Schlagworte:	Annealing Cadmium zinc telluride Cadmium zinc tellurides Characterization and Evaluation of Materials Chemical-mechanical polishing Chemistry and Materials Science Crystals Diffusion Diffusion layers Electronics and Microelectronics Equilibrium Focal plane Inclusions Infrared detectors Infrared imaging Instrumentation Materials Science Optical and Electronic Materials Original Research Article Sensors Solid State Physics Substrates Surface layers Surface treatment Temperature Transmittance X ray imagery
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