Detection of Scratch Defects on Metal Surfaces Based on MSDD-UNet

In this work, we enhanced the U-shaped network and proposed a method for detecting scratches on metal surfaces based on the Metal Surface Defect Detection U-Net (MSDD-UNet). Initially, we integrated a downsampling approach using a Space-To-Depth module and a lightweight channel attention module to a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Electronics (Basel) 2024-08, Vol.13 (16), p.3241
Hauptverfasser: Liu, Yan, Qin, Yunbai, Lin, Zhonglan, Xia, Haiying, Wang, Cong
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:In this work, we enhanced the U-shaped network and proposed a method for detecting scratches on metal surfaces based on the Metal Surface Defect Detection U-Net (MSDD-UNet). Initially, we integrated a downsampling approach using a Space-To-Depth module and a lightweight channel attention module to address the loss of contextual information in feature maps that results from multiple convolution and pooling operations. Building on this, we developed an improved attention module that utilizes image frequency decomposition and cross-channel self-attention mechanisms, as well as the strengths of convolutional encoders and self-attention blocks. Additionally, this attention module was integrated into the skip connections between the encoder and decoder. The purpose was to capture dense contextual information, highlight small and fine target areas, and assist in localizing micro and fine scratch defects. In response to the severe foreground–background class imbalance in scratch images, a hybrid loss function combining focal loss and D[sub.ice] loss was put forward to train the model for precise scratch segmentation. Finally, experiments were conducted on two surface defect datasets. The results reveal that our proposed method is more advantageous than other state-of-the-art scratch segmentation methods.
ISSN:2079-9292
2079-9292
DOI:10.3390/electronics13163241