Effect of cold working and annealing on microhardness of InBi1-xTex (x=0, 0.05, 0.1, 0.15) crystals

Indium bismuthide is a well-explored group III-V semi-metallic compound for IR technology applications. Here we report mechanical properties of this low band gap crystals using Zone melting method. The crystals of InBi1-xTex (x=0.05, 0.1, 0.15) were grown using Zone-melting method with 0.3cm/hr growth speed and 10 alternate zone passes. In the present work the microhardness of these crystals with the above said composition range has been investigated. The hardness has been studied with respect to applied load as well as of the composition of the crystal, at room temperature. InBi1-xTex (x=0.05, 0.1, 0.15) crystals exhibit impurity hardening as compared to the pure InBi crystal. Hardness tests were also performed on as-cleaved, cold-worked and annealed crystals. The impact of crystal perfection on microhardness has been studied and the detail results are reported. With increasing Te content, the hardness shows increasing trend.