SEE Failure Analysis of Hi-rel ASIC for Spacecraft Applications

Miniaturized electronic devices are essential to improve the performance, reduce the weight and volume, and improve reliability of electronic packages in a spacecraft. With technology scaling, a prime reliability challenge for CMOS devices used in spacecrafts is the occurrence of soft errors due to...

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Veröffentlicht in:	CEAS space journal 2024-09, Vol.16 (5), p.581-588
Hauptverfasser:	Padmapriya, K., Varaprasad, B. K. S. V. L., Mallik, Debjyoti
Format:	Artikel
Sprache:	eng
Schlagworte:	Aerospace Technology and Astronautics Application specific integrated circuits CMOS Data analysis Engineering Extraterrestrial radiation Failure analysis Fault location Heavy ions Original Paper Radiation Radiation tolerance Soft errors Spacecraft Spacecraft reliability
Online-Zugang:	Volltext
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