Analysis of CeO2/SiO2 double-layer thin film stack with antireflection effect for silicon solar cells

This study introduces CeO 2 /SiO 2 double-layer film stacks and its antireflection coating effect. Optical properties were analyzed by spectrophotometer measurements; surface morphology and cross-sections were observed by Scanning Electron Microscopy (SEM); elemental distributions and crystallograph...

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Veröffentlicht in:Journal of materials science. Materials in electronics 2024-08, Vol.35 (22), p.1497, Article 1497
Hauptverfasser: Kanmaz, Imran, Tomakin, Murat, Uzum, Abdullah
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Sprache:eng
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