Analysis of CeO2/SiO2 double-layer thin film stack with antireflection effect for silicon solar cells
This study introduces CeO 2 /SiO 2 double-layer film stacks and its antireflection coating effect. Optical properties were analyzed by spectrophotometer measurements; surface morphology and cross-sections were observed by Scanning Electron Microscopy (SEM); elemental distributions and crystallograph...
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Veröffentlicht in: | Journal of materials science. Materials in electronics 2024-08, Vol.35 (22), p.1497, Article 1497 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | This study introduces CeO
2
/SiO
2
double-layer film stacks and its antireflection coating effect. Optical properties were analyzed by spectrophotometer measurements; surface morphology and cross-sections were observed by Scanning Electron Microscopy (SEM); elemental distributions and crystallographic properties were determined by Energy Dispersive Spectroscopy (EDS) and X-ray Diffraction (XRD) measurements. Average reflectance of single-layer 0.3MSiO
2
, 0.6MSiO
2
, and 0.3MCeO
2
thin films were 30.54%, 20.12%, and 14.23%, respectively. Average reflectance was decreased significantly down to 5.9% by 0.3MCeO
2
/0.6MSiO
2
double-layer thin films comparing to those of the results of single-layer films and bare silicon surface reflection (~40%). Antireflective effect of the films on solar cells was estimated by simulation using the measured reflection data. Simulated solar cells indicate that 0.3MCeO
2
/0.6MSiO
2
double-layer antireflective coatings are capable to increase the efficiency significantly and conversion efficiency of 21.7% could be achieved. |
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ISSN: | 0957-4522 1573-482X |
DOI: | 10.1007/s10854-024-13245-5 |