Analysis of CeO2/SiO2 double-layer thin film stack with antireflection effect for silicon solar cells
This study introduces CeO 2 /SiO 2 double-layer film stacks and its antireflection coating effect. Optical properties were analyzed by spectrophotometer measurements; surface morphology and cross-sections were observed by Scanning Electron Microscopy (SEM); elemental distributions and crystallograph...
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| creator | Kanmaz, Imran Tomakin, Murat Uzum, Abdullah |
| description | This study introduces CeO
2
/SiO
2
double-layer film stacks and its antireflection coating effect. Optical properties were analyzed by spectrophotometer measurements; surface morphology and cross-sections were observed by Scanning Electron Microscopy (SEM); elemental distributions and crystallographic properties were determined by Energy Dispersive Spectroscopy (EDS) and X-ray Diffraction (XRD) measurements. Average reflectance of single-layer 0.3MSiO
2
, 0.6MSiO
2
, and 0.3MCeO
2
thin films were 30.54%, 20.12%, and 14.23%, respectively. Average reflectance was decreased significantly down to 5.9% by 0.3MCeO
2
/0.6MSiO
2
double-layer thin films comparing to those of the results of single-layer films and bare silicon surface reflection (~40%). Antireflective effect of the films on solar cells was estimated by simulation using the measured reflection data. Simulated solar cells indicate that 0.3MCeO
2
/0.6MSiO
2
double-layer antireflective coatings are capable to increase the efficiency significantly and conversion efficiency of 21.7% could be achieved. |
| doi_str_mv | 10.1007/s10854-024-13245-5 |
| format | Article |
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2
/SiO
2
double-layer film stacks and its antireflection coating effect. Optical properties were analyzed by spectrophotometer measurements; surface morphology and cross-sections were observed by Scanning Electron Microscopy (SEM); elemental distributions and crystallographic properties were determined by Energy Dispersive Spectroscopy (EDS) and X-ray Diffraction (XRD) measurements. Average reflectance of single-layer 0.3MSiO
2
, 0.6MSiO
2
, and 0.3MCeO
2
thin films were 30.54%, 20.12%, and 14.23%, respectively. Average reflectance was decreased significantly down to 5.9% by 0.3MCeO
2
/0.6MSiO
2
double-layer thin films comparing to those of the results of single-layer films and bare silicon surface reflection (~40%). Antireflective effect of the films on solar cells was estimated by simulation using the measured reflection data. Simulated solar cells indicate that 0.3MCeO
2
/0.6MSiO
2
double-layer antireflective coatings are capable to increase the efficiency significantly and conversion efficiency of 21.7% could be achieved.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-024-13245-5</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Alcohol ; Antireflection coatings ; Cerium oxides ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Coating effects ; Crystallography ; Efficiency ; Ethanol ; Materials Science ; Optical and Electronic Materials ; Optical properties ; Photovoltaic cells ; Reflectance ; Scanning electron microscopy ; Silicon ; Silicon dioxide ; Solar cells ; Spectrum analysis ; Thin film coatings ; Thin films</subject><ispartof>Journal of materials science. Materials in electronics, 2024-08, Vol.35 (22), p.1497, Article 1497</ispartof><rights>The Author(s) 2024</rights><rights>The Author(s) 2024. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c200t-402c31609c934b1985266dfc24d3194b3797063d13cedf89e6c3e2e9ede25c3c3</cites><orcidid>0000-0001-5324-8892 ; 0000-0001-8827-1590 ; 0000-0003-1887-848X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-024-13245-5$$EPDF$$P50$$Gspringer$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-024-13245-5$$EHTML$$P50$$Gspringer$$Hfree_for_read</linktohtml><link.rule.ids>314,780,784,27924,27925,41488,42557,51319</link.rule.ids></links><search><creatorcontrib>Kanmaz, Imran</creatorcontrib><creatorcontrib>Tomakin, Murat</creatorcontrib><creatorcontrib>Uzum, Abdullah</creatorcontrib><title>Analysis of CeO2/SiO2 double-layer thin film stack with antireflection effect for silicon solar cells</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>This study introduces CeO
2
/SiO
2
double-layer film stacks and its antireflection coating effect. Optical properties were analyzed by spectrophotometer measurements; surface morphology and cross-sections were observed by Scanning Electron Microscopy (SEM); elemental distributions and crystallographic properties were determined by Energy Dispersive Spectroscopy (EDS) and X-ray Diffraction (XRD) measurements. Average reflectance of single-layer 0.3MSiO
2
, 0.6MSiO
2
, and 0.3MCeO
2
thin films were 30.54%, 20.12%, and 14.23%, respectively. Average reflectance was decreased significantly down to 5.9% by 0.3MCeO
2
/0.6MSiO
2
double-layer thin films comparing to those of the results of single-layer films and bare silicon surface reflection (~40%). Antireflective effect of the films on solar cells was estimated by simulation using the measured reflection data. Simulated solar cells indicate that 0.3MCeO
2
/0.6MSiO
2
double-layer antireflective coatings are capable to increase the efficiency significantly and conversion efficiency of 21.7% could be achieved.</description><subject>Alcohol</subject><subject>Antireflection coatings</subject><subject>Cerium oxides</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Coating effects</subject><subject>Crystallography</subject><subject>Efficiency</subject><subject>Ethanol</subject><subject>Materials Science</subject><subject>Optical and Electronic Materials</subject><subject>Optical properties</subject><subject>Photovoltaic cells</subject><subject>Reflectance</subject><subject>Scanning electron microscopy</subject><subject>Silicon</subject><subject>Silicon dioxide</subject><subject>Solar cells</subject><subject>Spectrum analysis</subject><subject>Thin film coatings</subject><subject>Thin films</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>C6C</sourceid><recordid>eNp9kEtLAzEUhYMoWKt_wFXAdfTmNY9lKb6g0IUK7sI0c2NT00lNpkj_vaMjuHN1D5dzDpyPkEsO1xygvMkcKq0YCMW4FEozfUQmXJeSqUq8HpMJ1LpkSgtxSs5y3gBAoWQ1ITjrmnDIPtPo6ByX4ubJLwVt434VkIXmgIn2a99R58OW5r6x7_TT92vadL1P6ALa3seOonODoi4mmn3wdnjlGJpELYaQz8mJa0LGi987JS93t8_zB7ZY3j_OZwtmBUDPFAgreQG1raVa8brSoihaZ4VqJa_VSpZ1CYVsubTYuqrGwkoUWGOLQltp5ZRcjb27FD_2mHuzifs0LMxGQlWoUoGGwSVGl00x52GE2SW_bdLBcDDfOM2I0ww4zQ9Oo4eQHEN5MHdvmP6q_0l9ATxqd7k</recordid><startdate>20240801</startdate><enddate>20240801</enddate><creator>Kanmaz, Imran</creator><creator>Tomakin, Murat</creator><creator>Uzum, Abdullah</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>C6C</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-5324-8892</orcidid><orcidid>https://orcid.org/0000-0001-8827-1590</orcidid><orcidid>https://orcid.org/0000-0003-1887-848X</orcidid></search><sort><creationdate>20240801</creationdate><title>Analysis of CeO2/SiO2 double-layer thin film stack with antireflection effect for silicon solar cells</title><author>Kanmaz, Imran ; Tomakin, Murat ; Uzum, Abdullah</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c200t-402c31609c934b1985266dfc24d3194b3797063d13cedf89e6c3e2e9ede25c3c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Alcohol</topic><topic>Antireflection coatings</topic><topic>Cerium oxides</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Coating effects</topic><topic>Crystallography</topic><topic>Efficiency</topic><topic>Ethanol</topic><topic>Materials Science</topic><topic>Optical and Electronic Materials</topic><topic>Optical properties</topic><topic>Photovoltaic cells</topic><topic>Reflectance</topic><topic>Scanning electron microscopy</topic><topic>Silicon</topic><topic>Silicon dioxide</topic><topic>Solar cells</topic><topic>Spectrum analysis</topic><topic>Thin film coatings</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kanmaz, Imran</creatorcontrib><creatorcontrib>Tomakin, Murat</creatorcontrib><creatorcontrib>Uzum, Abdullah</creatorcontrib><collection>Springer Nature OA Free Journals</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kanmaz, Imran</au><au>Tomakin, Murat</au><au>Uzum, Abdullah</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analysis of CeO2/SiO2 double-layer thin film stack with antireflection effect for silicon solar cells</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2024-08-01</date><risdate>2024</risdate><volume>35</volume><issue>22</issue><spage>1497</spage><pages>1497-</pages><artnum>1497</artnum><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>This study introduces CeO
2
/SiO
2
double-layer film stacks and its antireflection coating effect. Optical properties were analyzed by spectrophotometer measurements; surface morphology and cross-sections were observed by Scanning Electron Microscopy (SEM); elemental distributions and crystallographic properties were determined by Energy Dispersive Spectroscopy (EDS) and X-ray Diffraction (XRD) measurements. Average reflectance of single-layer 0.3MSiO
2
, 0.6MSiO
2
, and 0.3MCeO
2
thin films were 30.54%, 20.12%, and 14.23%, respectively. Average reflectance was decreased significantly down to 5.9% by 0.3MCeO
2
/0.6MSiO
2
double-layer thin films comparing to those of the results of single-layer films and bare silicon surface reflection (~40%). Antireflective effect of the films on solar cells was estimated by simulation using the measured reflection data. Simulated solar cells indicate that 0.3MCeO
2
/0.6MSiO
2
double-layer antireflective coatings are capable to increase the efficiency significantly and conversion efficiency of 21.7% could be achieved.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-024-13245-5</doi><orcidid>https://orcid.org/0000-0001-5324-8892</orcidid><orcidid>https://orcid.org/0000-0001-8827-1590</orcidid><orcidid>https://orcid.org/0000-0003-1887-848X</orcidid><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| source | SpringerNature Journals |
| subjects | Alcohol Antireflection coatings Cerium oxides Characterization and Evaluation of Materials Chemistry and Materials Science Coating effects Crystallography Efficiency Ethanol Materials Science Optical and Electronic Materials Optical properties Photovoltaic cells Reflectance Scanning electron microscopy Silicon Silicon dioxide Solar cells Spectrum analysis Thin film coatings Thin films |
| title | Analysis of CeO2/SiO2 double-layer thin film stack with antireflection effect for silicon solar cells |
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