Effects of Sn doping on the structural, optical, photoluminescence, and electrical properties of transparent SeO2 thin films

The pure and Sn-doped SeO 2 thin films on borosilicate glass substrates were synthesized using a spray pyrolysis method. X-ray diffraction analysis revealed that higher and appropriate Sn doping concentrations would induce the thin film to transform from amorphous to crystalline behavior as the 7 wt...

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Veröffentlicht in:Applied physics. A, Materials science & processing Materials science & processing, 2024-08, Vol.130 (8), Article 596
Hauptverfasser: Suwanpanchoo, Chanidapa, Pusitthiakkachot, Thakerngsak, Raksa, Phathaitep, Tubtimtae, Auttasit, Wongrat, Ekasiddh
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Sprache:eng
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Zusammenfassung:The pure and Sn-doped SeO 2 thin films on borosilicate glass substrates were synthesized using a spray pyrolysis method. X-ray diffraction analysis revealed that higher and appropriate Sn doping concentrations would induce the thin film to transform from amorphous to crystalline behavior as the 7 wt% Sn-doped SeO 2 thin film had a polycrystalline hexagonal crystal structure. The Fourier transform infrared spectroscopy spectra show that high Sn doping concentrations in thin films exhibit the O–Sn–O bending and Sn–O stretching modes of SnO 2 , and the O = Se = O bond symmetric stretching vibration for all thin films. The high-resolution X-ray photoelectron spectroscopy measurement revealed the oxidation states of Se 0 , Se 4+ , and Se 6+ for SeO 2 and Sn 4+ for SnO 2 . The photoluminescence spectra revealed the intense ultraviolet and blue emission peaks and the weak green emission peak. A maximum optical transmittance of ~ 90% in the visible region can be displayed for the pure SeO 2 thin film and decreased with increasing Sn doping concentration as a window layer in solar cells and other optoelectronic devices. The energy band gap value for the pure SeO 2 was evaluated as 3.08 eV and reduced to 2.97, 2.88, 2.86, and 2.79 eV for 1, 3, 5, and 7 wt% Sn: SeO 2 , respectively. The lowest sheet resistance value was found for 5 wt% Sn: SeO 2 , which is 286 GΩ/sq. Furthermore, the high figure of merit values of 9.46 × 10 –2 Ω −1/12 and 8.86 × 10 –2 Ω −1/12 were obtained for pure and 5 wt% Sn: SeO 2 thin films, respectively. Graphical abstract
ISSN:0947-8396
1432-0630
DOI:10.1007/s00339-024-07749-4