Plasma-induced N doping and carbon vacancies in a self-supporting 3C-SiC photoanode for efficient photoelectrochemical water oxidation
Due to its suitable bandgap and excellent stability, 3C-SiC is being investigated as one of the promising candidates for photoelectrochemical (PEC) water oxidation. However, the limited surface activity and short carrier lifetime prevent 3C-SiC photoanodes from facilitating efficient PEC water split...
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Veröffentlicht in: | Journal of materials chemistry. A, Materials for energy and sustainability Materials for energy and sustainability, 2024-07, Vol.12 (3), p.1921-19211 |
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Hauptverfasser: | , , , , , , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Due to its suitable bandgap and excellent stability, 3C-SiC is being investigated as one of the promising candidates for photoelectrochemical (PEC) water oxidation. However, the limited surface activity and short carrier lifetime prevent 3C-SiC photoanodes from facilitating efficient PEC water splitting. To tackle these problems, this work proposes a plasma technique to control the crystal structure and optical characteristics of 3C-SiC. Nitrogen plasma induces carbon vacancies (V
c
) and Si-N bonds, further leading to a narrower bandgap of 3C-SiC. The combination of V
c
and N doping enhanced the light trapping capability of the electrode, thereby improving the efficiency of electron-hole pair separation and charge transfer, resulting in an accelerated water oxidation reaction,
i.e.
, photocurrent density (2.50 mA cm
−2
at 1.23 V
RHE
) increased by 7.6 times compared to that of pristine SiC. This work offers an effective strategy for regulating the electronic structure of SiC-based photoanodes by plasma treatment, which may be extended to other photoelectrodes for PEC application.
We report that a plasma-induced self-supporting 3C-SiC photoanode with N doping and carbon vacancies demonstrates high photocurrent density and stability for photoelectrochemical water oxidation in alkaline solution under simulated solar irradiation. |
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ISSN: | 2050-7488 2050-7496 |
DOI: | 10.1039/d4ta02612h |