97‐1: Late‐News Paper: Mechanism for the Irreversible Threshold Voltage Behavior by Polyimide Charging in Thin Film Transistors

97‐1: Late‐News Paper: Mechanism for the Irreversible Threshold Voltage Behavior by Polyimide Charging in Thin Film Transistors

The irreversible threshold voltage (Vth) shift by polyimide (PI) charging is experimentally demonstrated. The Vth of device without PI electrode is positively moved during the release. Interestingly, the shifted Vth is not recovered to initial value up to one month. The mechanism for the irreversibi...

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Veröffentlicht in:SID International Symposium Digest of technical papers 2024-06, Vol.55 (1), p.1242-1245
Hauptverfasser: Kim, Do Hyung, Kim, Min Ji, Choe, Huiyeon, Lee, Seulgi, Kim, Bohwa, Seo, Hyunsang, Yeon, Kiyoung, Ahn, Nari
Format: Artikel
Sprache:eng
Schlagworte:
Charging
Irreversible Vth shift
LTPS TFT
PI Charging
Polyimide
Semiconductor devices
Thin Film Transistor
Thin film transistors
Threshold voltage
Trap
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Beschreibung
Zusammenfassung:The irreversible threshold voltage (Vth) shift by polyimide (PI) charging is experimentally demonstrated. The Vth of device without PI electrode is positively moved during the release. Interestingly, the shifted Vth is not recovered to initial value up to one month. The mechanism for the irreversibility is suggested.
ISSN:0097-966X
2168-0159
DOI:10.1002/sdtp.17768