Composing and characterization of barium strontium titanate film doped with carbon dot

Barium Strontium Titanate (BaSrTiO3) film which was captured by carbon dot with variation container 0%, 2%, 4%, 6% using CSD method with the help of spin coating with a rotating speed of 8000 rpm has been successfully made on p-type silicon substrate 100. The film was annealed at 850 °C and held for 8 hours. Barium Strontium Titanate (BaSrTiO3) film at a concentration 0%, 2%, 4%, 6% carbon dot characterized by UV-VIS, XRD, SEM-EDX to produce bandgap energy in sequence 2.72 eV; 2.85 eV; 3.7 eV and 3.8 eV. The result of XRD characterization showed that the BST lattice structure is a cube with lattice parameters a=b=c in sequence of 4.066945 Å; 4.06868 Å; 4.072155 Å and 4.077379 Å. The result of SEM-EDX characterization showed that in the surface morphology of BST film the grain size was quite homogeneous and the corresponding atomic compositions obtained were Ba, Sr, Ti, O, and C