High Energy X-Ray Source Characterization at 0.450, 3, 6, 9, and 15 MVp

As the availability and importance of high energy X-ray sources grows, accurate source characterizations provide critical information for field flatness corrections, beam hardening corrections, detector response corrections, and radiation shielding assessments. This study uses MCNP6.2 to create accu...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of nondestructive evaluation 2024-09, Vol.43 (3), Article 70
Hauptverfasser: Hellmann, David, Liesenfelt, Michael, Hayward, Jason P.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:As the availability and importance of high energy X-ray sources grows, accurate source characterizations provide critical information for field flatness corrections, beam hardening corrections, detector response corrections, and radiation shielding assessments. This study uses MCNP6.2 to create accurate high definition angular and energy dependent X-ray source definitions for the most common high energy industrial X-ray sources at 450 kVp, 3 MVp, 6 MVp, 9 MVp, and 15 MVp.
ISSN:0195-9298
1573-4862
DOI:10.1007/s10921-024-01068-7