Synthesis and Physical Properties of Thin Ni–Al Films

Ni–Al films produced by resistive thermal evaporation using a VUP-5 vacuum station are studied. The basic stages in film synthesis are described. The wavefront velocity in synthesis is determined, along with the radial growth rate of the nuclei (islands) formed. The grain size in the surface is inve...

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Veröffentlicht in:	Russian engineering research 2024, Vol.44 (4), p.537-541
Hauptverfasser:	Malikov, V. N., Katasonov, A. O., Ishkov, A. V., Voinash, S. A., Zagidullin, R. R., Yakushev, A. M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Aluminum Electrical resistivity Engineering Engineering Design Fourier analysis Grain size Nickel Physical properties Synthesis Thin films Vacuum thermal evaporation Wave fronts
Online-Zugang:	Volltext
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