Synthesis and Physical Properties of Thin Ni–Al Films
Ni–Al films produced by resistive thermal evaporation using a VUP-5 vacuum station are studied. The basic stages in film synthesis are described. The wavefront velocity in synthesis is determined, along with the radial growth rate of the nuclei (islands) formed. The grain size in the surface is inve...
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| Veröffentlicht in: | Russian engineering research 2024, Vol.44 (4), p.537-541 |
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| container_title | Russian engineering research |
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| creator | Malikov, V. N. Katasonov, A. O. Ishkov, A. V. Voinash, S. A. Zagidullin, R. R. Yakushev, A. M. |
| description | Ni–Al films produced by resistive thermal evaporation using a VUP-5 vacuum station are studied. The basic stages in film synthesis are described. The wavefront velocity in synthesis is determined, along with the radial growth rate of the nuclei (islands) formed. The grain size in the surface is investigated. Fourier analysis provides information regarding the structural properties of the surface. The electrical conductivity of the thin metallic film is determined. |
| doi_str_mv | 10.3103/S1068798X24700618 |
| format | Article |
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N. ; Katasonov, A. O. ; Ishkov, A. V. ; Voinash, S. A. ; Zagidullin, R. R. ; Yakushev, A. M.</creator><creatorcontrib>Malikov, V. N. ; Katasonov, A. O. ; Ishkov, A. V. ; Voinash, S. A. ; Zagidullin, R. R. ; Yakushev, A. M.</creatorcontrib><description>Ni–Al films produced by resistive thermal evaporation using a VUP-5 vacuum station are studied. The basic stages in film synthesis are described. The wavefront velocity in synthesis is determined, along with the radial growth rate of the nuclei (islands) formed. The grain size in the surface is investigated. Fourier analysis provides information regarding the structural properties of the surface. 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R.</creatorcontrib><creatorcontrib>Yakushev, A. M.</creatorcontrib><title>Synthesis and Physical Properties of Thin Ni–Al Films</title><title>Russian engineering research</title><addtitle>Russ. Engin. Res</addtitle><description>Ni–Al films produced by resistive thermal evaporation using a VUP-5 vacuum station are studied. The basic stages in film synthesis are described. The wavefront velocity in synthesis is determined, along with the radial growth rate of the nuclei (islands) formed. The grain size in the surface is investigated. Fourier analysis provides information regarding the structural properties of the surface. The electrical conductivity of the thin metallic film is determined.</description><subject>Aluminum</subject><subject>Electrical resistivity</subject><subject>Engineering</subject><subject>Engineering Design</subject><subject>Fourier analysis</subject><subject>Grain size</subject><subject>Nickel</subject><subject>Physical properties</subject><subject>Synthesis</subject><subject>Thin films</subject><subject>Vacuum thermal evaporation</subject><subject>Wave fronts</subject><issn>1068-798X</issn><issn>1934-8088</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid/><recordid>eNplkM1Kw0AUhQdRsFYfwN2A6-i9c_MzsyzFWqFooVm4C2MyMVNiEmfSRXe-g2_okzilggtX98D5OOdyGLtGuCUEutsgpDJT8kXEGUCK8oRNUFEcSZDyNOhgRwf_nF14vwVIEpUkE5Zt9t3YGG89113F183e21K3fO36wbjRGs_7mueN7fiT_f78mrV8Ydt3f8nOat16c_V7pyxf3OfzZbR6fnicz1bRkKGMUKBE0gpNnKoE66oUWtWZIAqvaSAUVEtUQJVBJSgNRPKKWOpKamHSiqbs5hg7uP5jZ_xYbPud60JjQZDGSpISEChxpPzgbPdm3B-FUBz2Kf7tQz-ISVbE</recordid><startdate>2024</startdate><enddate>2024</enddate><creator>Malikov, V. 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| ispartof | Russian engineering research, 2024, Vol.44 (4), p.537-541 |
| issn | 1068-798X 1934-8088 |
| language | eng |
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| source | SpringerNature Journals |
| subjects | Aluminum Electrical resistivity Engineering Engineering Design Fourier analysis Grain size Nickel Physical properties Synthesis Thin films Vacuum thermal evaporation Wave fronts |
| title | Synthesis and Physical Properties of Thin Ni–Al Films |
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