Enhancement of plasmonic response by piezoelectrically deposited gold films

Thin film continuity using different fabrication processes is crucial in deciding its plasmonic response. The surface plasmon (SPR) response of gold films of various thicknesses deposited with and without a quartz base oscillating at 6 MHz was studied. The presence of the oscillating piezoelectric base resulted in a decrease in the surface roughness of the gold film. The 40 nm thick film displayed the best SPR response among the various thicknesses tested. The 40 nm film deposited piezoelectrically had a Q factor increase and an increased slope of the angle and wavelength dependent resonance curve as compared to 40 nm thick film not deposited piezoelectrically.