Characterization of ion-sensitive field effect transistor by varying channel length for different gate oxide thickness

In this age of nano-technology field effect transistors are widely used in semiconductor devices. ISFET has huge application in biological field due to its speedy response and high sensitivity. In this paper a simulation of ISFET has been done using the ENBIOS-2D tool. Types of ISFET based on its us...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Sen, Suchismita, Chakraborty, Pinaki, Sarkar, Argha
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:In this age of nano-technology field effect transistors are widely used in semiconductor devices. ISFET has huge application in biological field due to its speedy response and high sensitivity. In this paper a simulation of ISFET has been done using the ENBIOS-2D tool. Types of ISFET based on its uses are discussed. Development of ISFET in several years is mentioned. Mainly Variation of characteristic curves with varying channel width is examined and described.
ISSN:0094-243X
1551-7616
DOI:10.1063/5.0205264