Ir Transparency of Thin Bismuth Films

Ir Transparency of Thin Bismuth Films

The infrared transmission and reflection spectra of a series of samples of bismuth films of different thicknesses on identical single-crystal silicon substrates were measured. Transmission and reflection oscillations caused by interference on the film thickness are investigated. Properties of Si-pla...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Optics and spectroscopy 2023-10, Vol.131 (10), p.1087-1092
Hauptverfasser: Shamparov, E. Yu, Bugrimov, A. L., Rode, S. V., Jagrina, I. N.
Format: Artikel
Sprache:eng
Schlagworte:
Bismuth
Film thickness
Infrared reflection
Infrared spectra
Lasers
Optical Devices
Optics
Photonics
Physics
Physics and Astronomy
Refractivity
Silicon substrates
Single crystals
Thin films
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The infrared transmission and reflection spectra of a series of samples of bismuth films of different thicknesses on identical single-crystal silicon substrates were measured. Transmission and reflection oscillations caused by interference on the film thickness are investigated. Properties of Si-plates are estimated. Refractive index and absorption index of bismuth are calculated.
ISSN:0030-400X
1562-6911
DOI:10.1134/S0030400X23100223