$Submicron Focusing of X-rays by Silicon Planar Compound Refractive Lenses$

Submicron Focusing of X-rays by Silicon Planar Compound Refractive Lenses

The experimental study of optical properties of X-ray silicon planar compound refractive lenses at the synchrotron radiation source “KISI–Kurchatov” (Moscow, Russia) are presented. The capability to generate a submicron X-ray beam using refractive optics was demonstrated for the first time at this f...

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Veröffentlicht in:	Nanobiotechnology Reports (Online) 2023-12, Vol.18 (Suppl 1), p.S210-S216
Hauptverfasser:	Sorokovikov, M. N., Zverev, D. A., Barannikov, A. A., Yunkin, V. A., Seregin, A. Y., Volkovskiy, Y. A., Prosekov, P. A., Kohn, V. G., Folomeshkin, M. S., Blagov, A. E., Snigirev, A. A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Chemistry and Materials Science Industrial and Production Engineering Ion beams Knife-edge Machines Manufacturing Materials Science Nanophotonics Nanotechnology Optical properties Processes Radiation sources Refractive lenses Silicon compounds Synchrotron radiation X-rays
Online-Zugang:	Volltext
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