First-principles study on interfacial properties and the electronic structure of the Al(001)/MgAl2O4(001) interface
In this work, the interfacial structure, adhesion properties, and electronic structure of the Al(001)/MgAl 2 O 4 (001) interface are investigated via density functional theory calculations. Considering different termination atoms and stacking sites, six interfacial models are explored. The results s...
Gespeichert in:
Veröffentlicht in: | Journal of materials science 2024-02, Vol.59 (6), p.2375-2389 |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | In this work, the interfacial structure, adhesion properties, and electronic structure of the Al(001)/MgAl
2
O
4
(001) interface are investigated via density functional theory calculations. Considering different termination atoms and stacking sites, six interfacial models are explored. The results show that the OAlO-terminated O-top stacking configuration has the greatest interfacial adhesion work of 2.51 J m
−2
. The nature of bonding between atoms at the Al(001)/MgAl
2
O
4
(001) interface is determined by analyzing their interfacial electronic structures, such as valence charge density difference, Bader charge, and density of states. The atoms of the Al(001)/MgAl
2
O
4
(001) OAlO-terminal exhibit not only the Al-Al metal bonding but also ionic bonding. For the O-top and two hollow configurations, Al-O covalent bonding components are also present, which mainly originate from the coupling between the Al-3
p
and O-2
p
orbitals. In turn, the OAlO-terminated O-top stacking configuration possesses deeper negative energy bands in the Al-O resonance peaks of the interfacial atoms than the OAlO-terminated hollow stacking configuration, resulting in stronger interfacial bonding. Finally, the OAlO-terminated O-top stacking interface corresponds to the most stable interfacial structure. |
---|---|
ISSN: | 0022-2461 1573-4803 |
DOI: | 10.1007/s10853-024-09382-1 |