A study on strain and density in graphene-induced Bi2O3 thin film

An eccentric sol–gel method was used to synthesize the graphene oxide, reduced graphene oxide, Bi 2 O 3 and graphene-doped Bi 2 O 3 . The samples were subjected to X-ray diffraction for the structural analysis. The structural parameters of all the samples were estimated and various strains like lattice strain, RMS strain, etc. and densities like X-ray density, dislocation and screw density were also calculated. Modified Scherrer method and W–H plot method are also used to estimate the average crystallite size and the intrinsic strain of all the synthesized materials.