Dielectric constant of moderately doped InP at low frequencies and temperatures
. Dielectric measurements were carried out on moderately doped n -InP at low temperatures down to 10 K and at frequencies in the range of 120-10 5 Hz. The low-temperature asymptotic value of the relative dielectric constant ( ) was found to be greater than the host crystal value. The excess of above...
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Veröffentlicht in: | European physical journal plus 2016-02, Vol.131 (2), p.39, Article 39 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
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Zusammenfassung: | .
Dielectric measurements were carried out on moderately doped
n
-InP at low temperatures down to 10 K and at frequencies in the range of 120-10
5
Hz. The low-temperature asymptotic value of the relative dielectric constant (
) was found to be greater than the host crystal value. The excess of
above the host crystal value is attributed to the contribution of impurities. This contribution is originated from an overlap between adjacent wave functions of the impurities. A comparison was made with the theoretical approach taking into account the effect of such overlap and a good agreement was obtained. |
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ISSN: | 2190-5444 2190-5444 |
DOI: | 10.1140/epjp/i2016-16039-1 |