Experimental investigation of the gate voltage range of negative differential capacitance in ferroelectric transistors

Conclusion In this study, the impacts of sweeping rate and device parameters on the gate voltage range of the NDC phenomenon are investigated based on experiments. With the increase of the frequency and dielectric capacitance, the beginning gate voltage of the NC emergence will increase, and the gate duration voltage range and the maximum gate voltage amplification factor appear to increase first and then decrease. This work suggests a big challenge for scaled NCFETs to operate at high frequency with low V DD .