Measurement of Ion Energy by TOF Detection Technique in a Dense Plasma Focus Device

The determination of the ion beam characteristics such as detecting, measuring, and controlling are useful in dense plasma focus (DPF) device when dealing with material science. In this paper, a new technique is presented for the measurement of ion energy in a dense plasma focus (DPF) devices. An aluminum (Al) target was placed inside the vacuum vessel at 12 , 14 and 17 cm away from the focus region (anode end) at the angle of θ = 0 with respect to the device axis. After the plasma expansion phase, ions accelerate away from the anode tip by the induced electric fields and impact to the Al target, so X-ray is emitted. The emitted X-ray is detected by plastic scintillator photomultiplier detector. Time interval between the anode X-ray (first signal) and the target X-ray (second signal) results ions time of flight (TOF). The new indirect method for the measurement of the ion energy results 11–78 keV for H + and 74–222 keV for C +2 , C +3 and C +4 .