Dielectric Spectroscopy and Modulus Study of Aluminum Diphosphate AgAlP2O7

Argent aluminum diphosphate were prepared by the standard solid-state reaction technique and characterized by X-ray powder diffraction and IR spectroscopy. The effect of frequency and temperature on the dielectric parameters, such as the dielectric constant ε ′ , dielectric loss ε ″ , and the dielec...

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Veröffentlicht in:Journal of cluster science 2015-09, Vol.26 (5), p.1655-1669
Hauptverfasser: Taher, Y. Ben, Oueslati, A., Khirouni, K., Gargouri, M.
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Sprache:eng
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Zusammenfassung:Argent aluminum diphosphate were prepared by the standard solid-state reaction technique and characterized by X-ray powder diffraction and IR spectroscopy. The effect of frequency and temperature on the dielectric parameters, such as the dielectric constant ε ′ , dielectric loss ε ″ , and the dielectric loss tangent tan δ, have been studied in the temperature range from 440 to 640 K and in the frequency range from 40 Hz to 100 MHz. The modulus data are analyzed using the Kohlraush–Williams–Watts stretched exponential function. An analysis of dielectric loss data obeyed the Guintini’s theory of dielectric dispersion based on hopping model. The variation of the power m calculated from dielectric loss ε ″ , suggested that the transport in this material is explained according to correlated barrier hopping model. The activation energy value estimated from modulus was found to be 0.72 eV which is close to the values obtained from the complex polarizability plot.
ISSN:1040-7278
1572-8862
DOI:10.1007/s10876-015-0865-y