Computer vision based analysis and detection of defects in fruits causes due to nutrients deficiency

Presently, the fruit industry requires a fast and efficient method for classification and recognition of the quality of fruits in bulk processing. Fruit recognition based on computer vision is quite challenging as it is based on the intensity, size, contour, and texture features extraction from frui...

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Veröffentlicht in:Cluster computing 2020-09, Vol.23 (3), p.1817-1826
Hauptverfasser: Yogesh, Dubey, Ashwani Kumar, Ratan, Rajeev, Rocha, Alvaro
Format: Artikel
Sprache:eng
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Zusammenfassung:Presently, the fruit industry requires a fast and efficient method for classification and recognition of the quality of fruits in bulk processing. Fruit recognition based on computer vision is quite challenging as it is based on the intensity, size, contour, and texture features extraction from fruits along with their suitable classifier selection. In this paper, the pixels containing the defected regions are segmented and their features are extracted. Further, a support vector machine (SVM) classifier is used to identify the defects and recognizes the cause with its stage. During the process of classification, fruits are categorized into two groups, defected and no-defect. The sample image observed defected further classified into three categories as the first, second and final stage of fruit defect. The sample testing at an early stage helps one to further proceed with the production or halt based on the outcome of a computer vision-based recognition system.
ISSN:1386-7857
1573-7543
DOI:10.1007/s10586-019-03029-6